Moo sponsored National Junior’s Squash C/ship eying exciting conclusion
Apr 11, 2025
-Thrilling action unfolds on Day Three
Kaieteur Sports- The courts at the National Racquet Centre (NRC) were once again buzzing with intensity on Wednesday as Day Three of Moo’s National Junior Squash Championships got underway. With competition heating up across all divisions, several standout performances stole the spotlight.
Among the players making waves were Ethan Bulkan, Emily Fung-a-Fat, Justin Ten Pow, Kaylee Lowe, Demetri Lowe, and Louis Da Silva, who all recorded commanding victories in their respective categories.
In the Boys’ Under-13 division, Namishraj Singh faced a tough challenge against Benjamin Phang, falling in straight games (11-0, 11-3, 11-1). Rafael Braithwaite also came up short, losing a close contest 11-5, 11-9, 11-8.
The Girls’ Under-15 category delivered some of the most exciting action of the day. Emily Fung-a-Fat cruised to a 3-0 win over Mandica Munroe, while Tiana Gomes battled through a five-game thriller against Tehani Munroe to win 3-2. Zoey McDonald followed up with a dominant 3-0 victory over Munroe, handing her a second loss of the evening.
In the Boys’ U15 division, top seed Justin Ten Pow made light work of Kristen Vaipree, winning 11-1, 11-2, 11-1. Kaiden Alli mounted a strong comeback against Matthew Daby after dropping the first game, rallying to take the next three (2-11, 11-5, 11-0, 11-6). Second seed Ethan Bulkan delivered a solid 3-0 win over Jacob McDonald, while third seed Egan Bulkan continued his fine form with a composed 11-4, 11-3, 11-1 win against Jibril Ali.
In the Girls’ U17 bracket, Kaylee Lowe proved unstoppable with a clinical 3-0 win over Malia Maikoo.
The Boys’ U19 division featured two highly anticipated matchups. Demetri Lowe swept Nandishraj Singh in straight games, while Louis Da Silva pulled off an impressive upset over Shiloh Asregado, dominating 11-1, 11-4, and 11-4.
The action continued yesterday with even more thrilling encounters. Stay tuned for detailed coverage in the next edition of this publication.
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